A simple hard x-ray "nanoslit" for measuring wavefront intensity

Hidekazu Takano, Takuto Hashimoto, Takuya Tsuji, Takahisa Koyama, Yoshiyuki Tsusaka, Yasushi Kagoshima

研究成果: Article査読

3 被引用数 (Scopus)

抄録

A new method is proposed for nanoscale hard x-ray measurements. This method uses a reflection on a heavy-metal wire that functions as a single slit with a nanoscale aperture for a parallel x-ray beam. This "nanoslit" can be used to perform high-spatial-resolution measurements of the intensity distribution of a wavefront that diverges from an aperture. In experiments, Fresnel fringes generated by a rectangular aperture were measured using a 300-μm -diameter platinum wire as the nanoslit. In these experiments, the finest fringes with a period of 26 nm could be successfully resolved.

本文言語English
論文番号073702
ジャーナルReview of Scientific Instruments
81
7
DOI
出版ステータスPublished - 2010 7月
外部発表はい

ASJC Scopus subject areas

  • 器械工学

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