A scale estimation algorithm using phase-based correspondence matching for electron microscope images

Ayako Suzuki, Koichi Ito, Takafumi Aoki, Ruriko Tsuneta

研究成果: Conference contribution

抄録

This paper proposes a multi-stage scale estimation algorithm using phase-based correspondence matching for electron microscope images. Consider a sequence of microscope images of the same target object, where the image magnification is gradually increased so that the final image has a very large scale factor S (e.g., S = 1, 000) with respect to the initial image. The problem considered in this paper is to estimate the overall scale factor S of the given image sequence. The proposed scale estimation technique provides a new methodology for high-accuracy magnification calibration of electron microscopes. Experimental evaluation using Mandelbrot images as precisely scale-controlled image sequence shows that the proposed method can estimate the scale factor S = 1, 000 with approximately 0.1%-scale error. This paper also describes an application of the proposed algorithm to the magnification calibration of an actual STEM (Scanning Transmission Electron Microscope).

本文言語English
ホスト出版物のタイトルProceedings - 2010 20th International Conference on Pattern Recognition, ICPR 2010
ページ2420-2423
ページ数4
DOI
出版ステータスPublished - 2010 11 18
イベント2010 20th International Conference on Pattern Recognition, ICPR 2010 - Istanbul, Turkey
継続期間: 2010 8 232010 8 26

Other

Other2010 20th International Conference on Pattern Recognition, ICPR 2010
CountryTurkey
CityIstanbul
Period10/8/2310/8/26

ASJC Scopus subject areas

  • Computer Vision and Pattern Recognition

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