A microscope system for characterization of mechanical properties of small-scaled objects

Hironori Tohmyoh, M. A.S. Akanda, Masumi Saka

研究成果: Conference contribution

抄録

A new microscopy system for characterization of mechanical properties of small-scaled objects is reported. A force sensor, piezo stage, manual manipulators, etc. are integrated in a single platform and these are combined with a high-resolution digital microscope to acquire the load-displacement relationships of the small-scaled objects together with the corresponding deformation pattern of the objects during testing. A small-span bending test of ultrathin Pt wire is demonstrated and the results are discussed.

本文言語English
ホスト出版物のタイトルElectronics System Integration Technology Conference, ESTC 2010 - Proceedings
DOI
出版ステータスPublished - 2010 12月 1
イベント3rd Electronics System Integration Technology Conference, ESTC 2010 - Berlin, Germany
継続期間: 2010 9月 132010 9月 16

出版物シリーズ

名前Electronics System Integration Technology Conference, ESTC 2010 - Proceedings

Other

Other3rd Electronics System Integration Technology Conference, ESTC 2010
国/地域Germany
CityBerlin
Period10/9/1310/9/16

ASJC Scopus subject areas

  • 制御およびシステム工学
  • 電子工学および電気工学

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