A matched expansion MEMS probe card with low CTE LTCC substrate

Seong Hun Choe, Shuji Tanaka, Masayoshi Esashi

研究成果: Conference contribution

1 被引用数 (Scopus)

抄録

This paper describes the fabrication technology of a new MEMS-based probe card. The probe card is designed to satisfy requirements from advanced wafer-level burn-in LSI tests. The problem of thermal expansion mismatch between the probe card and LSI wafers is solved by using a LTCC (low temperature cofired ceramics) substrate with a coefficient of thermal expansion of 3.4 ppm/°C The probes are first formed on a silicon wafer, and then transferred to the LTCC substrate using Au/Sn solder bumps. The prototyped probe card was preliminarily evaluated in contact resistance. The measured contact resistance was 0.14 Q during 2500 touchdowns.

本文言語English
ホスト出版物のタイトル2007 IEEE International Test Conference, ITC
DOI
出版ステータスPublished - 2008 3 3
イベント2007 IEEE International Test Conference, ITC - Santa Clara, CA, United States
継続期間: 2007 10 232007 10 25

出版物シリーズ

名前Proceedings - International Test Conference
ISSN(印刷版)1089-3539

Other

Other2007 IEEE International Test Conference, ITC
CountryUnited States
CitySanta Clara, CA
Period07/10/2307/10/25

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Applied Mathematics

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