A high-resolution synchrotron-radiation angle-resolved photoemission spectrometer with in situ oxide thin film growth capability

K. Horiba, H. Ohguchi, H. Kumigashira, M. Oshima, K. Ono, N. Nakagawa, M. Lippmaa, M. Kawasaki, H. Koinuma

研究成果: Article査読

97 被引用数 (Scopus)

抄録

A study was performed on a high-resolution synchrotron-radiation angle-resolved photoemission (ARPES) spectrometer with in situ oxide thin film growth capability. It was used to investigate the electronic structure of transition metal oxide thin films. It was found that a momentum resolution of 0.02 Å-1 (0.2°) and a total energy resolution of 6.3 meV were obtained at a photon energy of 40 eV.

本文言語English
ページ(範囲)3406-3412
ページ数7
ジャーナルReview of Scientific Instruments
74
7
DOI
出版ステータスPublished - 2003 7 1
外部発表はい

ASJC Scopus subject areas

  • Instrumentation

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