A CMOS image sensor using floating capacitor load readout operation

S. Wakashima, Y. Goda, T. L. Li, R. Kuroda, S. Sugawa

研究成果: Conference contribution

3 被引用数 (Scopus)

抄録

In this paper, a CMOS image sensor using floating capacitor load readout operation has been discussed. The floating capacitor load readout operation is used during pixel signals readout. And this operation has two features: 1. in-pixel driver transistor drives load capacitor without current sources, 2. parasitic capacitor of pixel output vertical signal line is used as a sample/hold capacitor. This operation produces three advantages: a smaller chip size, a lower power consumption, and a lower output noise than conventional CMOS image sensors. The prototype CMOS image sensor has been produced using 0.18 μm 1-Poly 3-Metal CMOS process technology with pinned photodiodes. The chip size is 2.5 mmH × 2.5 mmV, the pixel size is 4.5 μmH × 4.5 μmV, and the number of pixels is 400 H x 300 V. This image sensor consists of only a pixel array, vertical and horizontal shift registers, column source followers of which height is as low as that of some pixels and output buffers. The size of peripheral circuit is reduced by 90.2 % of a conventional CMOS image sensor. The power consumption in pixel array is reduced by 96.9 %. Even if the power consumption of column source follower is included, it reduced by 39.0 %. With an introduction of buried channel transistors as in-pixel driver transistors, the dark random noise of pixels of the floating capacitor load readout operation CMOS image sensor is 168 μV rms. The noise of conventional image sensor is 466 μV rms; therefore, reduction of 63.8 % of noise was achieved.

本文言語English
ホスト出版物のタイトルProceedings of SPIE-IS and T Electronic Imaging - Sensors, Cameras, and Systems for Industrial and Scientific Applications XIV
DOI
出版ステータスPublished - 2013 4月 10
イベントSensors, Cameras, and Systems for Industrial and Scientific Applications XIV - Burlingame, CA, United States
継続期間: 2013 2月 62013 2月 7

出版物シリーズ

名前Proceedings of SPIE - The International Society for Optical Engineering
8659
ISSN(印刷版)0277-786X

Other

OtherSensors, Cameras, and Systems for Industrial and Scientific Applications XIV
国/地域United States
CityBurlingame, CA
Period13/2/613/2/7

ASJC Scopus subject areas

  • 電子材料、光学材料、および磁性材料
  • 凝縮系物理学
  • コンピュータ サイエンスの応用
  • 応用数学
  • 電子工学および電気工学

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