Three-dimentional structure of poly(styrene-block-isoprene) (SI) diblock copolymer thin films was studied by means of transmission electron microtomography (TEMT). After annealing at 120°C, it was found that the SI thin film spin-coated on silicon wafer exhibited Hexagonally Perforated Layer (HPL) morphology with its lamellae highly oriented parallel to the substrate. The stacking sequences of HPL channels can be modeled as both AB-stacking and ABC-stacking patterns, as illustrated in Fig. 1. As a result of three-dimensional observation, we found that this sample formed ABC-stacking.
|出版ステータス||Published - 2006 10月 18|
|イベント||55th SPSJ Annual Meeting - Nagoya, Japan|
継続期間: 2006 5月 24 → 2006 5月 26
|Other||55th SPSJ Annual Meeting|
|Period||06/5/24 → 06/5/26|
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