10 to 72-Gb/s, optoelectronic RZ pulse-pattern generation and its application to on-wafer large-signal characterization for ultrahigh-speed electronic devices

Taiichi Otsuji, Kazutoshi Kato, Tadao Nagatsuma, Mikio Yoneyama

研究成果: Paper査読

10 被引用数 (Scopus)

抄録

A pulse-rate tunable, fully electrically controllable optoelectronic random pulse generator operating at 10 to 72 Gb/s in return-to-zero (RZ) mode and an on-wafer optical-to-electrical conversion stimulus probe head with 0.6-A/W responsivity, 200-mVpp saturation output, and a near 100-GHz bandwidth is addressed. Its application, in combination with electrooptic sampling (EOS), to characterizing an ultrawide band amplifier is also demonstrated.

本文言語English
ページ203-204
ページ数2
出版ステータスPublished - 1994 12 1
外部発表はい
イベントProceedings of the 1994 IEEE LEOS Annual Meeting. Part 1 (of 2) - Boston, MA, USA
継続期間: 1994 10 311994 11 3

Other

OtherProceedings of the 1994 IEEE LEOS Annual Meeting. Part 1 (of 2)
CityBoston, MA, USA
Period94/10/3194/11/3

ASJC Scopus subject areas

  • 工学(全般)

フィンガープリント

「10 to 72-Gb/s, optoelectronic RZ pulse-pattern generation and its application to on-wafer large-signal characterization for ultrahigh-speed electronic devices」の研究トピックを掘り下げます。これらがまとまってユニークなフィンガープリントを構成します。

引用スタイル