年別の研究成果
年別の研究成果
フィンガープリント
Kohei Yamasueが活動している研究トピックを掘り下げます。このトピックラベルは、この研究者の研究成果に基づきます。これらがまとまってユニークなフィンガープリントを構成します。
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研究成果
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Atomic Resolution Studies on Surface Dipoles by Noncontact Scanning Nonlinear Dielectric Microscopy and Potentiometry
Yamasue, K. & Cho, Y., 2020 7, IFCS-ISAF 2020 - Joint Conference of the IEEE International Frequency Control Symposium and IEEE International Symposium on Applications of Ferroelectrics, Proceedings. Institute of Electrical and Electronics Engineers Inc., 9234884. (IFCS-ISAF 2020 - Joint Conference of the IEEE International Frequency Control Symposium and IEEE International Symposium on Applications of Ferroelectrics, Proceedings).研究成果: Conference contribution
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Influence of non-uniform interface defect clustering on field-effect mobility in sic mosfets investigated by local deep level transient spectroscopy and device simulation
Yamasue, K., Yamagishi, Y. & Cho, Y., 2020, Silicon Carbide and Related Materials 2019. Yano, H., Ohshima, T., Eto, K., Mitani, T., Harada, S. & Tanaka, Y. (eds.). Trans Tech Publications Ltd, p. 627-634 8 p. (Materials Science Forum; vol. 1004 MSF).研究成果: Conference contribution
1 被引用数 (Scopus) -
Nanoscale characterization of unintentional doping of atomically thin layered semiconductors by scanning nonlinear dielectric microscopy
Yamasue, K. & Cho, Y., 2020 8 21, In: Journal of Applied Physics. 128, 7, 0016462.研究成果: Article › 査読
1 被引用数 (Scopus) -
A Study on Evaluation of Interface Defect Density on High-K/SiO2/Si and SiO2/Si Gate Stacks using Scanning Nonlinear Dielectric Microscopy
Suzuki, K., Yamasue, K. & Cho, Y., 2019 10, 2019 IEEE International Integrated Reliability Workshop, IIRW 2019. Institute of Electrical and Electronics Engineers Inc., 8989881. (IEEE International Integrated Reliability Workshop Final Report; vol. 2019-October).研究成果: Conference contribution
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Boxcar averaging based scanning nonlinear dielectric microscopy and its application to carrier distribution Imaging on 2D Semiconductors
Yamasue, K. & Cho, Y., 2019 10, 2019 IEEE International Integrated Reliability Workshop, IIRW 2019. Institute of Electrical and Electronics Engineers Inc., 8989887. (IEEE International Integrated Reliability Workshop Final Report; vol. 2019-October).研究成果: Conference contribution
2 被引用数 (Scopus)