Sato, H.,
Honjo, H., Watanabe, T., Niwa, M.,
Koike, H.,
Miura, S., Saito, T., Inoue, H., Nasuno, T., Tanigawa, T., Noguchi, Y., Yoshiduka, T., Yasuhira, M.,
Ikeda, S., Kang, S. Y., Kubo, T., Yamashita, K., Yagi, Y., Tamura, R. &
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p. 27.2.1-27.2.4 8614606. (Technical Digest - International Electron Devices Meeting, IEDM; vol. 2018-December).
研究成果: Conference contribution