XPS study on band alignment at Pt-O-terminated ZnO(000̄1) interface

Taeyoung Kim, Michiko Yoshitake, Shinjiro Yagyu, Slavomir Nemsak, Takahiro Nagata, Toyohiro Chikyow

Research output: Contribution to journalArticlepeer-review

20 Citations (Scopus)

Abstract

The band alignment at the interface between Pt and O-terminated ZnO(0001) was investigated by depositing Pt films on ZnO using X-ray photoelectron spectroscopy and ultra violet photoelectron spectroscopy in an ultrahigh vacuum system. Angle-resolved X-ray photoelectron spectroscopy measurement showed the band was bent down by 0.06 eV at the ZnO(0001) surface. The binding energy of Zn 2p doublet shifted toward higher values by 0.37 eV when Pt was deposited on ZnO(0001). The work function of ZnO(0001) was 4.08 eV and the valence band maximum measured by UPS on the clean ZnO(0001) surface was 2.82 eV. As a result, the Schottky barrier height of Pt/ZnO(0001) was 0.72 eV in this experiment.

Original languageEnglish
Pages (from-to)1528-1531
Number of pages4
JournalSurface and Interface Analysis
Volume42
Issue number10-11
DOIs
Publication statusPublished - 2010 Oct 1
Externally publishedYes

Keywords

  • Band alignment
  • Pt
  • UPS
  • Work function
  • XPS
  • ZnO

ASJC Scopus subject areas

  • Chemistry(all)
  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry

Fingerprint Dive into the research topics of 'XPS study on band alignment at Pt-O-terminated ZnO(000̄1) interface'. Together they form a unique fingerprint.

Cite this