Abstract
Informatics tools are an important part of the high-throughput or combinatorial materials development process. Particularly for thin film studies, the rate of sample synthesis and characterization has increased to a point where the throughput of the whole materials development process is limited by the ability to process the characterization data and design new experiments. We describe in this work software tools that we have developed to solve the data management problems. In particular, we discuss the use of extensible markup language (XML) to address the problem of representing structurally varied experimental data in a data management system without having to make modifications to the core software parts whenever the materials processing or characterization tools or sample and data handling procedures change.
Original language | English |
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Pages (from-to) | 2634-2639 |
Number of pages | 6 |
Journal | Applied Surface Science |
Volume | 252 |
Issue number | 7 |
DOIs | |
Publication status | Published - 2006 Jan 21 |
Externally published | Yes |
Event | Proceedings of the Third Japan-US Workshop on Combinatorial Material Science and Technology CMST-e SI - Duration: 2004 Dec 7 → 2004 Dec 10 |
Keywords
- Data management system
- Materials informatics
- XML Schema
ASJC Scopus subject areas
- Chemistry(all)
- Condensed Matter Physics
- Physics and Astronomy(all)
- Surfaces and Interfaces
- Surfaces, Coatings and Films