XML-based data management system for combinatorial solid-state materials science

S. Meguro; M. Lippmaa; T. Ohnishi; T. Chikyow; H. Koinuma

doi:10.1016/j.apsusc.2005.05.084

XML-based data management system for combinatorial solid-state materials science

S. Meguro, M. Lippmaa, T. Ohnishi, T. Chikyow, H. Koinuma

Research output: Contribution to journal › Conference article › peer-review

7 Citations (Scopus)

Abstract

Informatics tools are an important part of the high-throughput or combinatorial materials development process. Particularly for thin film studies, the rate of sample synthesis and characterization has increased to a point where the throughput of the whole materials development process is limited by the ability to process the characterization data and design new experiments. We describe in this work software tools that we have developed to solve the data management problems. In particular, we discuss the use of extensible markup language (XML) to address the problem of representing structurally varied experimental data in a data management system without having to make modifications to the core software parts whenever the materials processing or characterization tools or sample and data handling procedures change.

Original language	English
Pages (from-to)	2634-2639
Number of pages	6
Journal	Applied Surface Science
Volume	252
Issue number	7
DOIs	https://doi.org/10.1016/j.apsusc.2005.05.084
Publication status	Published - 2006 Jan 21
Externally published	Yes
Event	Proceedings of the Third Japan-US Workshop on Combinatorial Material Science and Technology CMST-e SI - Duration: 2004 Dec 7 → 2004 Dec 10

Keywords

Data management system
Materials informatics
XML Schema

ASJC Scopus subject areas

Chemistry(all)
Condensed Matter Physics
Physics and Astronomy(all)
Surfaces and Interfaces
Surfaces, Coatings and Films

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10.1016/j.apsusc.2005.05.084

Cite this

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title = "XML-based data management system for combinatorial solid-state materials science",

abstract = "Informatics tools are an important part of the high-throughput or combinatorial materials development process. Particularly for thin film studies, the rate of sample synthesis and characterization has increased to a point where the throughput of the whole materials development process is limited by the ability to process the characterization data and design new experiments. We describe in this work software tools that we have developed to solve the data management problems. In particular, we discuss the use of extensible markup language (XML) to address the problem of representing structurally varied experimental data in a data management system without having to make modifications to the core software parts whenever the materials processing or characterization tools or sample and data handling procedures change.",

keywords = "Data management system, Materials informatics, XML Schema",

author = "S. Meguro and M. Lippmaa and T. Ohnishi and T. Chikyow and H. Koinuma",

note = "Funding Information: This work was carried out under the Visiting Researchers{\textquoteright} Program of the Institute for Solid State Physics, the University of Tokyo. Financial support from the Asahi Glass foundation is acknowledged.; Proceedings of the Third Japan-US Workshop on Combinatorial Material Science and Technology CMST-e SI ; Conference date: 07-12-2004 Through 10-12-2004",

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doi = "10.1016/j.apsusc.2005.05.084",

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T1 - XML-based data management system for combinatorial solid-state materials science

AU - Meguro, S.

AU - Lippmaa, M.

AU - Ohnishi, T.

AU - Chikyow, T.

AU - Koinuma, H.

N1 - Funding Information: This work was carried out under the Visiting Researchers’ Program of the Institute for Solid State Physics, the University of Tokyo. Financial support from the Asahi Glass foundation is acknowledged.

PY - 2006/1/21

Y1 - 2006/1/21

N2 - Informatics tools are an important part of the high-throughput or combinatorial materials development process. Particularly for thin film studies, the rate of sample synthesis and characterization has increased to a point where the throughput of the whole materials development process is limited by the ability to process the characterization data and design new experiments. We describe in this work software tools that we have developed to solve the data management problems. In particular, we discuss the use of extensible markup language (XML) to address the problem of representing structurally varied experimental data in a data management system without having to make modifications to the core software parts whenever the materials processing or characterization tools or sample and data handling procedures change.

AB - Informatics tools are an important part of the high-throughput or combinatorial materials development process. Particularly for thin film studies, the rate of sample synthesis and characterization has increased to a point where the throughput of the whole materials development process is limited by the ability to process the characterization data and design new experiments. We describe in this work software tools that we have developed to solve the data management problems. In particular, we discuss the use of extensible markup language (XML) to address the problem of representing structurally varied experimental data in a data management system without having to make modifications to the core software parts whenever the materials processing or characterization tools or sample and data handling procedures change.

KW - Data management system

KW - Materials informatics

KW - XML Schema

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EP - 2639

JO - Applied Surface Science

JF - Applied Surface Science

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T2 - Proceedings of the Third Japan-US Workshop on Combinatorial Material Science and Technology CMST-e SI

Y2 - 7 December 2004 through 10 December 2004

ER -

XML-based data management system for combinatorial solid-state materials science

Abstract

Keywords

ASJC Scopus subject areas

Access to Document

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