XAFS study on a pressure-induced superconductor Cs3C60 under high pressure

Satoshi Fujiki; Yoshihiro Kubozono; Yasuhiro Takabayashi; Setsuo Kashino; Shuichi Emura

doi:10.1107/S0909049501000218

XAFS study on a pressure-induced superconductor Cs₃C₆₀ under high pressure

Satoshi Fujiki, Yoshihiro Kubozono, Yasuhiro Takabayashi, Setsuo Kashino, Shuichi Emura

Advanced Institute for Materials Research (AIMR)

Research output: Contribution to journal › Article › peer-review

2 Citations (Scopus)

Abstract

Cs K-edge XAFS of Cs₃C₆₀ which is a pressure-induced superconductor were measured at 21 and 34 kbar by using a diamond anvil cell (DAC) in order to obtain the structural information under high pressure, and to clarify the origin of the pressure-induced superconductivity. The distances and the mean square displacements between the Cs and C atoms are consistent with those determined by X-ray powder diffraction. Consequently, the high-pressure XAFS can give the reliable structural-information on a fullerene superconductor under high pressure. We also show the procedure of the analysis of high-pressure XAFS with DAC in detail.

Original language	English
Pages (from-to)	725-727
Number of pages	3
Journal	Journal of Synchrotron Radiation
Volume	8
Issue number	2
DOIs	https://doi.org/10.1107/S0909049501000218
Publication status	Published - 2001 Mar 1

Keywords

Cs K-edge XAFS
DAC
High pressure
Pressure-induced superconductor

ASJC Scopus subject areas

Radiation
Nuclear and High Energy Physics
Instrumentation

Access to Document

10.1107/S0909049501000218

Cite this

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abstract = "Cs K-edge XAFS of Cs3C60 which is a pressure-induced superconductor were measured at 21 and 34 kbar by using a diamond anvil cell (DAC) in order to obtain the structural information under high pressure, and to clarify the origin of the pressure-induced superconductivity. The distances and the mean square displacements between the Cs and C atoms are consistent with those determined by X-ray powder diffraction. Consequently, the high-pressure XAFS can give the reliable structural-information on a fullerene superconductor under high pressure. We also show the procedure of the analysis of high-pressure XAFS with DAC in detail.",

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AU - Fujiki, Satoshi

AU - Kubozono, Yoshihiro

AU - Takabayashi, Yasuhiro

AU - Kashino, Setsuo

AU - Emura, Shuichi

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