XAFS analysis on amorphous and crystalline new phase change material GeCu2Te3

K. Kamimura, S. Hosokawa, N. Happo, H. Ikemoto, Y. Sutou, S. Shindo, Y. Saito, J. Koike

Research output: Contribution to journalArticlepeer-review

5 Citations (Scopus)

Abstract

The structure of crystalline and amorphous GeCu2Te3 phase change material was investigated by x-ray absorption fine structure. The averaged interatomic distances of Ge-Te and Cu-Te in the crystal phase are confirmed to contradict the x-ray diffraction data, and are mostly equal to the experimental data in the amorphous phase. As regards the coordination numbers, the atomic configurations around the Ge atoms are a small modification of the crystalline one, while those around the Cu atoms are quite different and the large number of the Cu-Cu homopolar coordination become an important role in the amorphous phase. The x-ray absorption near edge structure data near the Ge K edge show a similarity of the local atomic configurations around the Ge atoms between the crystalline and amorphous GeCu2Te3. However, those near the Cu K edge indicate a large smearing-out on the amorphization, corresponding the large differences in the atomic configurations around the Cu atoms.

Original languageEnglish
Pages (from-to)248-253
Number of pages6
JournalJournal of Optoelectronics and Advanced Materials
Volume18
Issue number3-4
Publication statusPublished - 2016 Mar 1

Keywords

  • Local structure
  • Phase change material
  • XAFS

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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