Abstract
A white X-ray beam was irradiated on a copper phthalocyanine (CuPc) thin film under grazing incidence condition, and X-rays propagated in the film due to the waveguide phenomenon were observed by an energy-dispersive detector. Energy profiles of guided X-rays showed four specific resonant modes. By comparing them with the calculated ones, a three-layer model of CuPc film was proposed.
Original language | English |
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Pages (from-to) | 227-231 |
Number of pages | 5 |
Journal | Physica B: Condensed Matter |
Volume | 357 |
Issue number | 1-2 SPEC. ISS. |
DOIs | |
Publication status | Published - 2005 Feb 28 |
Keywords
- Organic thin film
- X-ray reflectivity
- X-ray waveguide
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Electrical and Electronic Engineering