X-ray waveguide phenomenon in copper phthalocyanine thin film

Kouichi Hayashi

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

A white X-ray beam was irradiated on a copper phthalocyanine (CuPc) thin film under grazing incidence condition, and X-rays propagated in the film due to the waveguide phenomenon were observed by an energy-dispersive detector. Energy profiles of guided X-rays showed four specific resonant modes. By comparing them with the calculated ones, a three-layer model of CuPc film was proposed.

Original languageEnglish
Pages (from-to)227-231
Number of pages5
JournalPhysica B: Condensed Matter
Volume357
Issue number1-2 SPEC. ISS.
DOIs
Publication statusPublished - 2005 Feb 28

Keywords

  • Organic thin film
  • X-ray reflectivity
  • X-ray waveguide

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'X-ray waveguide phenomenon in copper phthalocyanine thin film'. Together they form a unique fingerprint.

  • Cite this