Abstract
A white X-ray beam was irradiated on a copper phthalocyanine (CuPc) thin film under grazing incidence condition, and X-rays propagated in the film due to the waveguide phenomenon were observed by an energy-dispersive detector. Energy profiles of guided X-rays showed four specific resonant modes. By comparing them with the calculated ones, a three-layer model of CuPc film was proposed.
| Original language | English |
|---|---|
| Pages (from-to) | 227-231 |
| Number of pages | 5 |
| Journal | Physica B: Condensed Matter |
| Volume | 357 |
| Issue number | 1-2 SPEC. ISS. |
| DOIs | |
| Publication status | Published - 2005 Feb 28 |
Keywords
- Organic thin film
- X-ray reflectivity
- X-ray waveguide
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Electrical and Electronic Engineering
Fingerprint Dive into the research topics of 'X-ray waveguide phenomenon in copper phthalocyanine thin film'. Together they form a unique fingerprint.
Cite this
Hayashi, K. (2005). X-ray waveguide phenomenon in copper phthalocyanine thin film. Physica B: Condensed Matter, 357(1-2 SPEC. ISS.), 227-231. https://doi.org/10.1016/j.physb.2004.11.063