X-ray source combined ultrahigh-vacuum scanning tunneling microscopy for elemental analysis

Y. Hasegawa, K. Tsuji, K. Nakayama, K. Wagatsuma, T. Sakurai

Research output: Contribution to journalConference articlepeer-review

11 Citations (Scopus)

Abstract

An X-ray induced current under ultra high vacuum-scanning tunneling microscopy (STM) was observed in STM images. The relative height of silver layer with respect to the copper substrate changed with radiation. The X-ray induced current and the apparent height increased on the application of a bias voltage to the tip.

Original languageEnglish
Pages (from-to)2676-2680
Number of pages5
JournalJournal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
Volume18
Issue number6
DOIs
Publication statusPublished - 2000 Nov
Event44th International Conference on Electron, Ion, and Photon Beam Technology and Nanofabrication - Rancho Mirage, CA, USA
Duration: 2000 May 302000 Jun 2

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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