TY - JOUR
T1 - X-ray production by channeled ions
AU - Ohura, M.
AU - Ozawa, K.
AU - Chang, J. H.
AU - Yamamoto, Y.
AU - Morita, S.
AU - Ishii, K.
PY - 1987/12/1
Y1 - 1987/12/1
N2 - RBS and X-ray spectra have been measured for random and aligned (parallel to 〈100〉 axis) orientation of Si crystals and SOS (silicon on sapphire) crystals of 4000 Å thick Si. The projectile energy has been changed over the ranges 0.5-2.0 MeV for protons and 0.25-0.6 MeV/amu for α particles. The ratio of X-ray counts of the aligned case to those of the random case is shown as a function of projectile energy separately for Si K X-rays and continuum bremsstrahlung. The impact-parameter dependence of ion-atom collisions for producing these X-rays is discussed.
AB - RBS and X-ray spectra have been measured for random and aligned (parallel to 〈100〉 axis) orientation of Si crystals and SOS (silicon on sapphire) crystals of 4000 Å thick Si. The projectile energy has been changed over the ranges 0.5-2.0 MeV for protons and 0.25-0.6 MeV/amu for α particles. The ratio of X-ray counts of the aligned case to those of the random case is shown as a function of projectile energy separately for Si K X-rays and continuum bremsstrahlung. The impact-parameter dependence of ion-atom collisions for producing these X-rays is discussed.
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U2 - 10.1016/0168-9002(87)90204-X
DO - 10.1016/0168-9002(87)90204-X
M3 - Article
AN - SCOPUS:0023536620
VL - 262
SP - 137
EP - 140
JO - Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
JF - Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
SN - 0168-9002
IS - 1
ER -