X-ray photon correlation spectroscopy study in valence fluctuation compound Eu3S4

H. Nakao, K. Ohwada, S. Shimomura, Akira Ochiai, K. Namikawa, J. Mizuki, H. Mimura, K. Yamauchi, Y. Murakami

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

X-ray photon correlation spectroscopy (XPCS) is a powerful tool to perform direct measurements of the dynamics of fluctuations in condensed matter systems at atomic resolution. Here we have investigated spatial and time correlations of domains in the valence fluctuated phase in a typical valence fluctuation compound Eu3S4 near the charge ordering temperature (TCO). The spatial correlation was observed at the fundamental reflection (4 4 4) using coherent diffraction techniques, which indicated that the domain size is longer than 200 nm near TCO. The time correlation of the domain was measured by the XPCS technique, and we found that the slow fluctuation of the order of 10 second exists only near TCO.

Original languageEnglish
Title of host publicationSRI 2009 - The 10th International Conference on Synchrotron Radiation Instrumentation
Pages935-938
Number of pages4
DOIs
Publication statusPublished - 2010 Aug 3
Event10th International Conference on Synchrotron Radiation Instrumentation, SRI 2009 - Melbourne, VIC, Australia
Duration: 2009 Sep 272009 Oct 2

Publication series

NameAIP Conference Proceedings
Volume1234
ISSN (Print)0094-243X
ISSN (Electronic)1551-7616

Other

Other10th International Conference on Synchrotron Radiation Instrumentation, SRI 2009
CountryAustralia
CityMelbourne, VIC
Period09/9/2709/10/2

Keywords

  • coherent x-ray scattering
  • speckle scattering
  • valence fluctuation

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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