X-ray photoelectron spectroscopy study on the CrN surface grown on sapphire substrate to control the polarity of ZnO by plasma-assisted molecular beam epitaxy

J. H. Chang, M. N. Jung, J. S. Park, S. H. Park, I. H. Im, H. J. Lee, J. S. Ha, K. Fujii, T. Hanada, T. Yao, Y. Murakami, N. Ohtsu, G. S. Kil

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)

Abstract

We have studied on the polarity selection procedure of ZnO grown on CrN buffer by using X-ray photoelectron spectroscopy (XPS). XPS studies have been performed on the O- and Zn-treated CrN/Al 2 O 3 surfaces and revealed that Cr 2 O 3 and Zn-chromate-like structures are formed on O- and Zn-treated CrN surfaces, respectively. The polarity selection procedure is explained in terms of the variation of bonding coordination by the formation of ZnO on the topmost O- and Zn-atoms of each surface.

Original languageEnglish
Pages (from-to)8582-8586
Number of pages5
JournalApplied Surface Science
Volume255
Issue number20
DOIs
Publication statusPublished - 2009 Jul 30

Keywords

  • Polarity, ZnO, CrN, X-ray photoelectron spectroscopy

ASJC Scopus subject areas

  • Chemistry(all)
  • Condensed Matter Physics
  • Physics and Astronomy(all)
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films

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