X-ray photoelectron spectroscopic studies on phase identification and quantification of nickel aluminides

Naofumi Ohtsu, Masaoki Oku, Toetsu Shishido, Kazuaki Wagatsuma

Research output: Contribution to journalArticlepeer-review

17 Citations (Scopus)

Abstract

Core-level XPS spectra for clean surfaces of Ni 3 Al, NiAl, and NiAl 3 alloys were studied. The clean surfaces were obtained by fracturing in the ultra-high vacuum chamber. The positive chemical shifts of Ni 2p 3/2 peak for NiAl and NiAl 3 from Ni metal were 0.2 and 1.0 eV, respectively. The negative shift for Al 2p peak and the positive shift for Ni 3p peaks increased with the decreasing concentration of the corresponding elements. The peak position of the bulk plasmon loss peak for Al 2s peak shifted toward higher energy side, and further, the intensity ratio decreased with the decrease in aluminum concentration. Both the peak intensity ratios of Al 2p to Ni 3p determined by factor analysis and convenient separation are proportional to the atomic ratio of aluminum to nickel. The results indicate that the intensity ratio of Al 2p to Ni 3p determined by these two methods can be applied to the quantification for the surface of the nickel-aluminum alloys.

Original languageEnglish
Pages (from-to)8713-8717
Number of pages5
JournalApplied Surface Science
Volume253
Issue number21
DOIs
Publication statusPublished - 2007 Aug 31

Keywords

  • Chemical shift
  • Core-level XPS spectra
  • Fracturing
  • Nickel aluminides
  • Quantification

ASJC Scopus subject areas

  • Chemistry(all)
  • Condensed Matter Physics
  • Physics and Astronomy(all)
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films

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