X-ray phase tomography with a Talbot interferometer in combination with an X-ray imaging microscope

Atsushi Momose, Yoshihiro Takeda, Wataru Yashiro, Akihisa Takeuchi, Yoshio Suzuki

Research output: Contribution to journalArticlepeer-review

7 Citations (Scopus)

Abstract

An X-ray Talbot interferometer was combined with an X-ray imaging microscope to generate differential phase contrast. X-ray phase tomography was attained based on the measurement of the differential phase shift using the fringe scanning method. Polymer blend samples were observed and phase separation structures were depicted. The spatial resolution was 1.3 μm in this test experiment, which will be easily improved by increasing the magnification.

Original languageEnglish
Article number012044
JournalJournal of Physics: Conference Series
Volume186
DOIs
Publication statusPublished - 2009

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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