X-ray phase scanning setup for non-destructive testing using Talbot-Lau interferometer

S. Bachche, M. Nonoguchi, K. Kato, M. Kageyama, T. Koike, M. Kuribayashi, A. Momose

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)


X-ray grating interferometry has a great potential for X-ray phase imaging over conventional X-ray absorption imaging which does not provide significant contrast for weakly absorbing objects and soft biological tissues. X-ray Talbot and Talbot-Lau interferometers which are composed of transmission gratings and measure the differential X-ray phase shifts have gained popularity because they operate with polychromatic beams. In X-ray radiography, especially for nondestructive testing in industrial applications, the feasibility of continuous sample scanning is not yet completely revealed. A scanning setup is frequently advantageous when compared to a direct 2D static image acquisition in terms of field of view, exposure time, illuminating radiation, etc. This paper demonstrates an efficient scanning setup for grating-based Xray phase imaging using laboratory-based X-ray source. An apparatus consisting of an X-ray source that emits X-rays vertically, optical gratings and a photon-counting detector was used with which continuously moving objects across the field of view as that of conveyor belt system can be imaged. The imaging performance of phase scanner was tested by scanning a long continuous moving sample at a speed of 5 mm/s and absorption, differential-phase and visibility images were generated by processing non-uniform moire movie with our specially designed phase measurement algorithm. A brief discussion on the feasibility of phase scanner with scanning setup approach including X-ray phase imaging performance is reported. The successful results suggest a breakthrough for scanning objects those are moving continuously on conveyor belt system non-destructively using the scheme of X-ray phase imaging.

Original languageEnglish
Title of host publicationAdvances in Laboratory-Based X-Ray Sources, Optics, and Applications V
EditorsGert E. van Dorssen, Ali M. Khounsary
ISBN (Electronic)9781510603196
Publication statusPublished - 2016
Externally publishedYes
EventAdvances in Laboratory-Based X-Ray Sources, Optics, and Applications V - San Diego, United States
Duration: 2016 Aug 302016 Aug 31

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X


OtherAdvances in Laboratory-Based X-Ray Sources, Optics, and Applications V
Country/TerritoryUnited States
CitySan Diego

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering


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