Abstract
The top layer of a cleaved surface of the single layered manganite La0.5Sr1.5MnO4 is measured with crystal truncation rod scattering. Knowledge of the surface structure of strongly correlated electron systems is needed for nano-science and device application of such systems. The result shows that the cleaved surface is terminated by La/Sr layer and has little surface roughness.
Original language | English |
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Pages (from-to) | 5741-5743 |
Number of pages | 3 |
Journal | Thin Solid Films |
Volume | 515 |
Issue number | 14 SPEC. ISS. |
DOIs | |
Publication status | Published - 2007 May 23 |
Externally published | Yes |
Keywords
- Layered structure
- Manganese oxide
- Surface X-ray scattering
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Surfaces and Interfaces
- Surfaces, Coatings and Films
- Metals and Alloys
- Materials Chemistry