X-ray investigation of cleavage plane of single layered manganite La0.5Sr1.5MnO4

Y. Wakabayashi; M. H. Upton; S. Grenier; J. P. Hill; C. S. Nelson; H. Zheng; J. F. Mitchell

doi:10.1016/j.tsf.2006.12.124

X-ray investigation of cleavage plane of single layered manganite La_0.5Sr_1.5MnO₄

Y. Wakabayashi, M. H. Upton, S. Grenier, J. P. Hill, C. S. Nelson, H. Zheng, J. F. Mitchell

Research output: Contribution to journal › Article › peer-review

3 Citations (Scopus)

Abstract

The top layer of a cleaved surface of the single layered manganite La_0.5Sr_1.5MnO₄ is measured with crystal truncation rod scattering. Knowledge of the surface structure of strongly correlated electron systems is needed for nano-science and device application of such systems. The result shows that the cleaved surface is terminated by La/Sr layer and has little surface roughness.

Original language	English
Pages (from-to)	5741-5743
Number of pages	3
Journal	Thin Solid Films
Volume	515
Issue number	14 SPEC. ISS.
DOIs	https://doi.org/10.1016/j.tsf.2006.12.124
Publication status	Published - 2007 May 23
Externally published	Yes

Keywords

Layered structure
Manganese oxide
Surface X-ray scattering

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Surfaces and Interfaces
Surfaces, Coatings and Films
Metals and Alloys
Materials Chemistry

Access to Document

10.1016/j.tsf.2006.12.124

Cite this

@article{b5be9dbc23074b7c938744a6300d637d,

title = "X-ray investigation of cleavage plane of single layered manganite La0.5Sr1.5MnO4 ",

abstract = "The top layer of a cleaved surface of the single layered manganite La0.5Sr1.5MnO4 is measured with crystal truncation rod scattering. Knowledge of the surface structure of strongly correlated electron systems is needed for nano-science and device application of such systems. The result shows that the cleaved surface is terminated by La/Sr layer and has little surface roughness.",

keywords = "Layered structure, Manganese oxide, Surface X-ray scattering",

author = "Y. Wakabayashi and Upton, {M. H.} and S. Grenier and Hill, {J. P.} and Nelson, {C. S.} and H. Zheng and Mitchell, {J. F.}",

note = "Funding Information: We thank Dr. A. Checco for helping with the AFM measurements. This work was supported by the Yamada Science Foundation, Support for long-term visit, and US DOE, Basic Energy Sciences at Brookhaven under contract No. DE-AC02-98CH10886 and at Argonne under contract No. W-31-109-Eng-38. ",

year = "2007",

month = may,

day = "23",

doi = "10.1016/j.tsf.2006.12.124",

language = "English",

volume = "515",

pages = "5741--5743",

journal = "Thin Solid Films",

issn = "0040-6090",

publisher = "Elsevier",

number = "14 SPEC. ISS.",

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TY - JOUR

T1 - X-ray investigation of cleavage plane of single layered manganite La0.5Sr1.5MnO4

AU - Wakabayashi, Y.

AU - Upton, M. H.

AU - Grenier, S.

AU - Hill, J. P.

AU - Nelson, C. S.

AU - Zheng, H.

AU - Mitchell, J. F.

N1 - Funding Information: We thank Dr. A. Checco for helping with the AFM measurements. This work was supported by the Yamada Science Foundation, Support for long-term visit, and US DOE, Basic Energy Sciences at Brookhaven under contract No. DE-AC02-98CH10886 and at Argonne under contract No. W-31-109-Eng-38.

PY - 2007/5/23

Y1 - 2007/5/23

N2 - The top layer of a cleaved surface of the single layered manganite La0.5Sr1.5MnO4 is measured with crystal truncation rod scattering. Knowledge of the surface structure of strongly correlated electron systems is needed for nano-science and device application of such systems. The result shows that the cleaved surface is terminated by La/Sr layer and has little surface roughness.

AB - The top layer of a cleaved surface of the single layered manganite La0.5Sr1.5MnO4 is measured with crystal truncation rod scattering. Knowledge of the surface structure of strongly correlated electron systems is needed for nano-science and device application of such systems. The result shows that the cleaved surface is terminated by La/Sr layer and has little surface roughness.

KW - Layered structure

KW - Manganese oxide

KW - Surface X-ray scattering

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DO - 10.1016/j.tsf.2006.12.124

M3 - Article

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VL - 515

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EP - 5743

JO - Thin Solid Films

JF - Thin Solid Films

SN - 0040-6090

IS - 14 SPEC. ISS.

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