X-ray investigation of cleavage plane of single layered manganite La0.5Sr1.5MnO4

Y. Wakabayashi, M. H. Upton, S. Grenier, J. P. Hill, C. S. Nelson, H. Zheng, J. F. Mitchell

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

The top layer of a cleaved surface of the single layered manganite La0.5Sr1.5MnO4 is measured with crystal truncation rod scattering. Knowledge of the surface structure of strongly correlated electron systems is needed for nano-science and device application of such systems. The result shows that the cleaved surface is terminated by La/Sr layer and has little surface roughness.

Original languageEnglish
Pages (from-to)5741-5743
Number of pages3
JournalThin Solid Films
Volume515
Issue number14 SPEC. ISS.
DOIs
Publication statusPublished - 2007 May 23
Externally publishedYes

Keywords

  • Layered structure
  • Manganese oxide
  • Surface X-ray scattering

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Metals and Alloys
  • Materials Chemistry

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    Wakabayashi, Y., Upton, M. H., Grenier, S., Hill, J. P., Nelson, C. S., Zheng, H., & Mitchell, J. F. (2007). X-ray investigation of cleavage plane of single layered manganite La0.5Sr1.5MnO4 Thin Solid Films, 515(14 SPEC. ISS.), 5741-5743. https://doi.org/10.1016/j.tsf.2006.12.124