X-ray imaging microscopy at 25 keV with Fresnel zone plate optics

M. Awaji, Y. Suzuki, A. Takeuchi, H. Takano, N. Kamijo, S. Tamura, M. Yasumoto

Research output: Contribution to journalArticlepeer-review

24 Citations (Scopus)


X-ray imaging microscopy with a sputtered-sliced Fresnel zone plate (SS-FZP) has been developed at an X-ray energy of 25 keV. Objects were imaged in transmission with the SS-FZP as an objective with a magnification of 10.2 times, and detected with a X-ray image sensor. The performance of the imaging microscope has been tested with a gold mesh and a resolution test pattern at an undulator beamline 47XU of SPring-8. The resolution test patterns up to 0.5 μm line-and-space structures have been resolved.

Original languageEnglish
Pages (from-to)845-848
Number of pages4
JournalNuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Issue numberPART II
Publication statusPublished - 2001
Externally publishedYes


  • Diffuser
  • Imaging hard x-ray microscopy
  • Incoherent illumination
  • Speckle noise
  • Sputtered-sliced Fresnel zone plate
  • Undulator radiation

ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Instrumentation


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