X-Ray Fluorescence Holography of SrTiO                         3                          Compared with X-Ray Photoelectron Holography

Jun Kawai; Kouichi Hayashi; Tokujirou Yamamoto; Shinjiro Hayakawa; Yohichi Gohshi

doi:10.2116/analsci.14.903

X-Ray Fluorescence Holography of SrTiO ₃ Compared with X-Ray Photoelectron Holography

Jun Kawai, Kouichi Hayashi, Tokujirou Yamamoto, Shinjiro Hayakawa, Yohichi Gohshi

Materials Development Division

Research output: Contribution to journal › Article › peer-review

15 Citations (Scopus)

Abstract

Strontium K _α X-ray fluorescence intensity of SrTiO ₃ (001) single crystal is measured as a function of azimuthal and polar angles of detection. Anisotropy is observed due to the interference effect of fluorescent X-rays in the solid. X-Ray fluorescence holography is discussed from the viewpoint of chemical analysis. X-Ray photoelectron intensity anisotropy is compared with the present measurement.

Original language	English
Pages (from-to)	903-907
Number of pages	5
Journal	analytical sciences
Volume	14
Issue number	5
DOIs	https://doi.org/10.2116/analsci.14.903
Publication status	Published - 1998

Keywords

Holography
X-Ray fluorescence
X-ray photoelectron diffraction

ASJC Scopus subject areas

Analytical Chemistry

Access to Document

10.2116/analsci.14.903

Cite this

X-Ray Fluorescence Holography of SrTiO ₃ Compared with X-Ray Photoelectron Holography . / Kawai, Jun; Hayashi, Kouichi; Yamamoto, Tokujirou; Hayakawa, Shinjiro; Gohshi, Yohichi.

In: analytical sciences, Vol. 14, No. 5, 1998, p. 903-907.

Research output: Contribution to journal › Article › peer-review

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