X-ray fluorescence holography

Kouichi Hayashi, Naohisa Happo, Shinya Hosokawa, Wen Hu, Tomohiro Matsushita

Research output: Contribution to journalReview articlepeer-review

58 Citations (Scopus)

Abstract

X-ray fluorescence holography (XFH) is a method of atomic resolution holography which utilizes fluorescing atoms as a wave source or a monitor of the interference field within a crystal sample. It provides three-dimensional atomic images around a specified element and has a range of up to a few nm in real space. Because of this feature, XFH is expected to be used for medium-range local structural analysis, which cannot be performed by x-ray diffraction or x-ray absorption fine structure analysis. In this article, we explain the theory of XFH including solutions to the twin-image problem, an advanced measuring system, and data processing for the reconstruction of atomic images. Then, we briefly introduce our recent applications of this technique to the analysis of local lattice distortions in mixed crystals and nanometer-size clusters appearing in the low-temperature phase of a shape-memory alloy.

Original languageEnglish
Article number093201
JournalJournal of Physics Condensed Matter
Volume24
Issue number9
DOIs
Publication statusPublished - 2012 Mar 7

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics

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