X-ray diffractometry for the structure determination of a submicrometre single powder grain

Nobuhiro Yasuda, Haruno Murayama, Yoshimitsu Fukuyama, Jungeun Kim, Shigeru Kimura, Koshiro Toriumi, Yoshihito Tanaka, Yutaka Moritomo, Yoshihiro Kuroiwa, Kenichi Kato, Hitoshi Tanaka, Masaki Takata

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Engineering & Materials Science

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