Write margin measurement of bit patterned media with 20 nm dots

Hideki Saga, Kazuki Shirahata, Ryo Terashima, Takehito Shimatsu, Hajime Aoi, Hiroaki Muraoka

Research output: Contribution to journalArticlepeer-review

Fingerprint

Dive into the research topics of 'Write margin measurement of bit patterned media with 20 nm dots'. Together they form a unique fingerprint.

Engineering & Materials Science