Work-function variation induced fluctuation in bias-temperature-instability characteristics of emerging metal-gate devices and implications for digital design

Seid Hadi Rasouli, Kazuhiko Endo, Kaustav Banerjee

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Citations (Scopus)

Abstract

This paper, for the first time, shows that the work-function variation (WFV) in emerging metal-gate devices results in significant fluctuation in the gate-oxide electric field, and hence fluctuation in bias temperature instability (BTI) characteristics (both NBTI and PBTI). We modify the existing NBTI and PBTI models in order to accurately characterize the BTI characteristics of the metalgate devices. It is shown that the impact of the oxide electric field on threshold voltage degradation is substantially underestimated if WFV is neglected. Moreover, in FinFET devices, work-function variation Induced electric field (which is independent of the gate-source bias) not only results in fluctuation in the BTI characteristics, but also causes variation in the recovery process. It is highlighted for the first time that WFV induced BTI fluctuation can have significant impact on the performance and reliability characteristics of digital circuits such as SRAM cells and Domino logic gates.

Original languageEnglish
Title of host publication2010 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2010
Pages714-720
Number of pages7
DOIs
Publication statusPublished - 2010 Dec 1
Externally publishedYes
Event2010 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2010 - San Jose, CA, United States
Duration: 2010 Nov 72010 Nov 11

Publication series

NameIEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD
ISSN (Print)1092-3152

Other

Other2010 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2010
CountryUnited States
CitySan Jose, CA
Period10/11/710/11/11

ASJC Scopus subject areas

  • Software
  • Computer Science Applications
  • Computer Graphics and Computer-Aided Design

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