The principle of a Weissenberg camera is applied to surface crystallographic analysis by reflection high-energy electron diffraction. By removing inelastic electrons and measuring hundreds of patterns as a function of sample rotation angle, kinematical analysis can be performed over a large volume of reciprocal space. The data set is equivalent to a three-dimensional stack of Weissenberg photographs. The method is applied to analysis of an Si(111)-3×3-Ag surface, and the structural data obtained are in excellent agreement with the known atomic structure.
ASJC Scopus subject areas
- Physics and Astronomy(all)