Wavelength dispersive X-ray spectrometer for small area X-ray fluorescence spectroscopy at SPring-8 BL39XU

Shinjiro Hayakawa, Akihisa Yamaguchi, Wan Hong, Yohichi Gohshi, Tokujiro Yamamoto, Kouichi Hayashi, Jun Kawai, Shunji Goto

Research output: Contribution to journalArticle

14 Citations (Scopus)

Abstract

A wavelength dispersive X-ray spectrometer is designed and developed for X-ray fluorescence analysis and spectroscopy using an X-ray microprobe at SPring-8 BL39XU. The spectrometer uses a flat analyzer crystal, and X-rays from a small beam spot are dispersed by the crystal onto a position sensitive proportional counter. The energy resolution of the spectrometer is determined by the spatial resolution of the position sensitive proportional counter, and the additional use of the slit-scan can improve the energy resolution if necessary. Performance of the spectrometer is evaluated by using a conventional X-ray source, and preliminary experimental results of the X-ray microprobe by using brilliant hard X-rays from an X-ray undulator are reported.

Original languageEnglish
Pages (from-to)171-177
Number of pages7
JournalSpectrochimica acta, Part B: Atomic spectroscopy
Volume54
Issue number1
DOIs
Publication statusPublished - 1999 Jan 4

ASJC Scopus subject areas

  • Analytical Chemistry
  • Atomic and Molecular Physics, and Optics
  • Instrumentation
  • Spectroscopy

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