A wavelength dispersive X-ray spectrometer is designed and developed for X-ray fluorescence analysis and spectroscopy using an X-ray microprobe at SPring-8 BL39XU. The spectrometer uses a flat analyzer crystal, and X-rays from a small beam spot are dispersed by the crystal onto a position sensitive proportional counter. The energy resolution of the spectrometer is determined by the spatial resolution of the position sensitive proportional counter, and the additional use of the slit-scan can improve the energy resolution if necessary. Performance of the spectrometer is evaluated by using a conventional X-ray source, and preliminary experimental results of the X-ray microprobe by using brilliant hard X-rays from an X-ray undulator are reported.
ASJC Scopus subject areas
- Analytical Chemistry
- Atomic and Molecular Physics, and Optics