Wavefront measurement for a hard-X-ray nanobeam using single-grating interferometry

Satoshi Matsuyama, Hikaru Yokoyama, Ryosuke Fukui, Yoshiki Kohmura, Kenji Tamasaku, Makina Yabashi, Wataru Yashiro, Atsushi Momose, Tetsuya Ishikawa, Kazuto Yamauchi

Research output: Contribution to journalArticlepeer-review

38 Citations (Scopus)

Abstract

Wavefront measurement for a hard-X-ray nanobeam using single-grating interferometry based on the Talbot effect and the Fourier transform method was demonstrated in the 1-km-long beamline of SPring-8. 10 keV X-rays were one-dimensionally focused down to 32 nm using a total-reflection elliptical mirror. An intentionally distorted wavefront was generated using a deformable mirror placed just upstream of the focusing mirror. The wavefront measured by interferometry was cross-checked with the phase retrieval method using intensity profiles around the beam waist. Comparison of the obtained wavefront errors revealed that they are in good agreement with each other and with the wavefront error estimated from the shape of the deformable mirror at a ∼0.5 rad level.

Original languageEnglish
Pages (from-to)24977-24986
Number of pages10
JournalOptics Express
Volume20
Issue number22
DOIs
Publication statusPublished - 2012 Oct 22

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

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