VUV and Soft-X-Ray Photoemission Studies of Electronic and Atomic Structures of Metal-Overlayers on Silicon Surfaces

S. Kono, Y. Enta, Tadashi Abukawa, N. Nakamura, K. Anno, S. Suzuki

Research output: Contribution to journalArticlepeer-review

5 Citations (Scopus)

Abstract

Electronic and atomic structures of ordered metal-overlayers on Si(111) and Si(001) surfaces have been investigated by angle-resolved photoelectron spectroscopy. In the VUV photon energy region, angle-resolved photoemission has given us information about surface-state dispersion, and in the soft x-ray region, angle-resolved photoemission has given us information about surface atomic geometry. Metal overlayers treated are those of elements in the periodic table of Columns Ia, Ib, IIIb, IVb, IVb/Vb and VIb; surface orders treated are 3 × 3 on the Si(111) surface and 2 × 1 on the Si(001) surface.

Original languageEnglish
Pages (from-to)96-102
Number of pages7
JournalPhysica Scripta
Volume1990
Issue numberT31
DOIs
Publication statusPublished - 1990 Jan 1

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Mathematical Physics
  • Condensed Matter Physics

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