Voltage and Frequency Dependence of Capacitance Characteristics in Organic MOS Capacitors

Yoshinari Kimura, Yoshiaki Hattori, Masatoshi Kitamura

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

Pentacene metal-oxide-semiconductor capacitors having a channel area uncovered with the top electrode have been examined by capacitance-voltage (C-V) and capacitance-frequency (C-f) measurements. The C-V and C-f characteristics were reproduced using an equivalent circuit based on a distributed constant circuit. The sheet resistance, which characterizes carrier transport in the pentacene film, was obtained as a sheet resistance included in the equivalent circuit reproducing the measured characteristics.

Original languageEnglish
Title of host publication2019 Compound Semiconductor Week, CSW 2019 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781728100807
DOIs
Publication statusPublished - 2019 May
Externally publishedYes
Event2019 Compound Semiconductor Week, CSW 2019 - Nara, Japan
Duration: 2019 May 192019 May 23

Publication series

Name2019 Compound Semiconductor Week, CSW 2019 - Proceedings

Conference

Conference2019 Compound Semiconductor Week, CSW 2019
Country/TerritoryJapan
CityNara
Period19/5/1919/5/23

Keywords

  • C-f characteristics
  • C-V characteristics
  • organic MOS capacitors
  • pentacene

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Industrial and Manufacturing Engineering
  • Electronic, Optical and Magnetic Materials
  • Materials Chemistry
  • Atomic and Molecular Physics, and Optics

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