Visualization using the scanning nonlinear dielectric microscopy of electrons and holes localized in the thin gate film of metal-oxide-nitride- oxide-semiconductor type flash memory

Koichiro Honda, Yasuo Cho

Research output: Contribution to conferencePaperpeer-review

3 Citations (Scopus)

Fingerprint

Dive into the research topics of 'Visualization using the scanning nonlinear dielectric microscopy of electrons and holes localized in the thin gate film of metal-oxide-nitride- oxide-semiconductor type flash memory'. Together they form a unique fingerprint.

Engineering & Materials Science