Visualization of the recovery process of defects in a cultured cell layer by chemical imaging sensor

Koichiro Miyamoto, Bing Yu, Hiroko Isoda, Torsten Wagner, Michael J. Schöning, Tatsuo Yoshinobu

Research output: Contribution to journalArticle

5 Citations (Scopus)

Abstract

The chemical imaging sensor is a field-effect sensor which is able to visualize both the distribution of ions (in LAPS mode) and the distribution of impedance (in SPIM mode) in the sample. In this study, a novel cell assay is proposed, in which the chemical imaging sensor operated in SPIM mode is applied to monitor the recovery of defects in a cell layer brought into proximity of the sensing surface. A reduced impedance at a defect formed artificially in a cell layer was successfully visualized in a photocurrent image. The cell layer was cultured over two weeks, during which the temporal change of the photocurrent distribution corresponding to the recovery of the defect was observed.

Original languageEnglish
Pages (from-to)965-969
Number of pages5
JournalSensors and Actuators, B: Chemical
Volume236
DOIs
Publication statusPublished - 2016 Nov 29

Keywords

  • Cell migration assay
  • Chemical imaging sensor
  • Scanning photo-induced impedance microscopy
  • Wound-healing assay

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Instrumentation
  • Condensed Matter Physics
  • Surfaces, Coatings and Films
  • Metals and Alloys
  • Electrical and Electronic Engineering
  • Materials Chemistry

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