Visualization of defects on a cultured cell layer by utilizing chemical imaging sensor

Ko Ichiro Miyamoto, Yu Bing, Torsten Wagner, Tatsuo Yoshinobu, Michael J. Schöning

Research output: Contribution to journalConference articlepeer-review

1 Citation (Scopus)

Abstract

The chemical imaging sensor is a field-effect sensor which is able to visualize both the distribution of ions (in LAPS mode) and the distribution of impedance (in SPIM mode) in the sample. In this study, a novel wound-healing assay is proposed, in which the chemical imaging sensor operated in SPIM mode is applied to monitor the defect of a cell layer brought into proximity of the sensing surface. A reduced impedance inside the defect, which was artificially formed in a cell layer, was successfully visualized in a photocurrent image.

Original languageEnglish
Pages (from-to)936-939
Number of pages4
JournalProcedia Engineering
Volume120
DOIs
Publication statusPublished - 2015 Jan 1
Event29th European Conference on Solid-State Transducers, EUROSENSORS 2015; Freiburg; Germany; 6 September 2015 through 9 September 2015. - Freiburg, Germany
Duration: 2015 Sep 62015 Sep 9

Keywords

  • Chemical imaging sensor
  • SPIM, impedance, wound-healing assay

ASJC Scopus subject areas

  • Engineering(all)

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