Visualization of defects on a cultured cell layer by utilizing chemical imaging sensor

Ko Ichiro Miyamoto; Yu Bing; Torsten Wagner; Tatsuo Yoshinobu; Michael J. Schöning

doi:10.1016/j.proeng.2015.08.806

Visualization of defects on a cultured cell layer by utilizing chemical imaging sensor

Ko Ichiro Miyamoto, Yu Bing, Torsten Wagner, Tatsuo Yoshinobu, Michael J. Schöning

Research output: Contribution to journal › Conference article › peer-review

1 Citation (Scopus)

Abstract

The chemical imaging sensor is a field-effect sensor which is able to visualize both the distribution of ions (in LAPS mode) and the distribution of impedance (in SPIM mode) in the sample. In this study, a novel wound-healing assay is proposed, in which the chemical imaging sensor operated in SPIM mode is applied to monitor the defect of a cell layer brought into proximity of the sensing surface. A reduced impedance inside the defect, which was artificially formed in a cell layer, was successfully visualized in a photocurrent image.

Original language	English
Pages (from-to)	936-939
Number of pages	4
Journal	Procedia Engineering
Volume	120
DOIs	https://doi.org/10.1016/j.proeng.2015.08.806
Publication status	Published - 2015 Jan 1
Event	29th European Conference on Solid-State Transducers, EUROSENSORS 2015; Freiburg; Germany; 6 September 2015 through 9 September 2015. - Freiburg, Germany Duration: 2015 Sep 6 → 2015 Sep 9

Keywords

Chemical imaging sensor
SPIM, impedance, wound-healing assay

ASJC Scopus subject areas

Engineering(all)

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10.1016/j.proeng.2015.08.806

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title = "Visualization of defects on a cultured cell layer by utilizing chemical imaging sensor",

abstract = "The chemical imaging sensor is a field-effect sensor which is able to visualize both the distribution of ions (in LAPS mode) and the distribution of impedance (in SPIM mode) in the sample. In this study, a novel wound-healing assay is proposed, in which the chemical imaging sensor operated in SPIM mode is applied to monitor the defect of a cell layer brought into proximity of the sensing surface. A reduced impedance inside the defect, which was artificially formed in a cell layer, was successfully visualized in a photocurrent image.",

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language = "English",

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T1 - Visualization of defects on a cultured cell layer by utilizing chemical imaging sensor

AU - Miyamoto, Ko Ichiro

AU - Bing, Yu

AU - Wagner, Torsten

AU - Yoshinobu, Tatsuo

AU - Schöning, Michael J.

PY - 2015/1/1

Y1 - 2015/1/1

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AB - The chemical imaging sensor is a field-effect sensor which is able to visualize both the distribution of ions (in LAPS mode) and the distribution of impedance (in SPIM mode) in the sample. In this study, a novel wound-healing assay is proposed, in which the chemical imaging sensor operated in SPIM mode is applied to monitor the defect of a cell layer brought into proximity of the sensing surface. A reduced impedance inside the defect, which was artificially formed in a cell layer, was successfully visualized in a photocurrent image.

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KW - SPIM, impedance, wound-healing assay

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