TY - JOUR
T1 - Vibrational modes of C60 fullerene on Si(100)2x1 surface
AU - Suto, S.
AU - Kasuya, A.
AU - Ikeno, O.
AU - Horiguchi, N.
AU - Achiba, Y.
AU - Goto, T.
AU - Nishina, Y.
N1 - Funding Information:
Acknowledgments We thank Prof. H. Shinohara, Prof. Y. Saito and Prof. K Toji for their contribution to our sample preparation. We also thank Prof. R. Czajka, Dr. A. Wawro and Mr. K. Takanashi for their help in measurements. This work was supported in part by Grant-in-Aid for new program from the Ministry of Education, Science and culture.
PY - 1993/12/12
Y1 - 1993/12/12
N2 - We have measured coverage and scattering angle dependences on the electron energy loss by vibrational excitations of C60 on the Si(100)2x1 surface using a high-resolution spectrometer. If C60 is evaporated 5 Å (approximately half a monolayer) on Si(100), a strong energy loss peak appears at 65 meV, and weak peaks and shoulders at 72, 144, and 175 meV. In the 12 Å thick film, additional weak peaks at 96, 160, and 189 meV become more apparent. Intensities of these peaks are comparable to those of thick films measured by infra-red absorption and by Raman scattering spectroscopies. These results suggest appreciable interactions between C60 and the dangling bonds of Si surface.
AB - We have measured coverage and scattering angle dependences on the electron energy loss by vibrational excitations of C60 on the Si(100)2x1 surface using a high-resolution spectrometer. If C60 is evaporated 5 Å (approximately half a monolayer) on Si(100), a strong energy loss peak appears at 65 meV, and weak peaks and shoulders at 72, 144, and 175 meV. In the 12 Å thick film, additional weak peaks at 96, 160, and 189 meV become more apparent. Intensities of these peaks are comparable to those of thick films measured by infra-red absorption and by Raman scattering spectroscopies. These results suggest appreciable interactions between C60 and the dangling bonds of Si surface.
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U2 - 10.1016/0368-2048(93)80163-G
DO - 10.1016/0368-2048(93)80163-G
M3 - Article
AN - SCOPUS:0042021531
VL - 64-65
SP - 877
EP - 882
JO - Journal of Electron Spectroscopy and Related Phenomena
JF - Journal of Electron Spectroscopy and Related Phenomena
SN - 0368-2048
IS - C
ER -