Variation-resilient current-mode logic circuit design using MTJ devices

Research output: Contribution to conferencePaper

5 Citations (Scopus)

Abstract

A current-mode logic-circuit style using MTJ devices as threshold voltage (V th) variation compensating elements is proposed for realizing a process-variation-aware VLSI processor with maintaining a higher performance capability. The faulty logic-operation behavior due to V th variation of each MOS transistor can be neglected by adjusting resistance values of MTJ devices that are connected to the source electrode of MOS transistors in series. By using HSPICE simulation under a 90nm CMOS technology, it is demonstrated that basic current-mode logic gates using the proposed method are robust against the V th variation.

Original languageEnglish
Pages2705-2708
Number of pages4
DOIs
Publication statusPublished - 2012 Sep 28
Event2012 IEEE International Symposium on Circuits and Systems, ISCAS 2012 - Seoul, Korea, Republic of
Duration: 2012 May 202012 May 23

Other

Other2012 IEEE International Symposium on Circuits and Systems, ISCAS 2012
CountryKorea, Republic of
CitySeoul
Period12/5/2012/5/23

ASJC Scopus subject areas

  • Hardware and Architecture
  • Electrical and Electronic Engineering

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    Kim, Y., Natsui, M., & Hanyu, T. (2012). Variation-resilient current-mode logic circuit design using MTJ devices. 2705-2708. Paper presented at 2012 IEEE International Symposium on Circuits and Systems, ISCAS 2012, Seoul, Korea, Republic of. https://doi.org/10.1109/ISCAS.2012.6271866