Variation of magnetic properties along the film thickness in perpendicular thin film media investigated by optical method

Shin Saito, Yoshihito Hatta, Migaku Takahashi

Research output: Contribution to journalConference articlepeer-review

Abstract

Local variation of magnetic properties along the film thickness for CoNiCrTa perpendicular thin film media is discussed based on the magneto-optical analysis. It is found that the thickness of the bottom layer, which has low coercivity, is roughly estimated to be about 10nm. Furthermore, the hysteresis loop of the bottom layer can be calculated by using magneto-optical multilayer model.

Original languageEnglish
Pages (from-to)120-125
Number of pages6
JournalJournal of Magnetism and Magnetic Materials
Volume235
Issue number1-3
DOIs
Publication statusPublished - 2001 Oct
EventProceedings of the 5th Perpendicular Magnetic Recording Conference (PMRC 2000) - Sendai, Japan
Duration: 2000 Oct 232000 Oct 26

Keywords

  • Light incident side
  • Magneto-optical multilayer model
  • Perpendicular thin film media
  • Polar Kerr rotation
  • Wavelength dependence

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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