Variation-effect analysis of MTJ-based multiple-valued programmable resistors

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Nonvolatile multiple-valued programmable resistors based on series-parallel-connected magnetic tunnel junction (MTJ) devices are proposed for process-variation-resilient logic LSIs. Since the proposed resistors are designed using several MTJ devices of equal size, they can be fabricated without using special fabrication technologies such as that used to fabricate conventional MTJ-based multilevel resistors. In this paper, the process variation tolerance of the proposed resistors is evaluated through the Monte-Carlo analysis using a SPICE simulator with built-in MTJ device model.

Original languageEnglish
Title of host publicationProceedings - 2014 IEEE 44th International Symposium on Multiple-Valued Logic, ISMVL 2014
PublisherIEEE Computer Society
Pages243-247
Number of pages5
ISBN (Print)9781479935345
DOIs
Publication statusPublished - 2014 Jan 1
Event44th IEEE International Symposium on Multiple-Valued Logic, ISMVL 2014 - Bremen, Germany
Duration: 2014 May 192014 May 21

Publication series

NameProceedings of The International Symposium on Multiple-Valued Logic
ISSN (Print)0195-623X

Other

Other44th IEEE International Symposium on Multiple-Valued Logic, ISMVL 2014
CountryGermany
CityBremen
Period14/5/1914/5/21

Keywords

  • Combined resistance
  • Magnetic tunnel junction device
  • Monte-Carlo analysis
  • Process variation

ASJC Scopus subject areas

  • Computer Science(all)
  • Mathematics(all)

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