Valence electron spectroscopy for transmission electron microscopy

    Research output: Chapter in Book/Report/Conference proceedingChapter

    9 Citations (Scopus)

    Abstract

    Soft-X-ray emission spectroscopy (SXES) based on transmission electron microscopy can give us information of energy state of valence electrons (bonding electrons) from small specimen areas examined by microscopy, electron diffraction, and elemental analysis. The information of valence electrons cannot be directly obtained by electron energy-loss spectroscopy (EELS) widely used nowadays. In this chapter, developments of SXES instruments for conventional transmission electron microscopes (TEMs) and those results applied to materials to obtain information of valence electrons are described.

    Original languageEnglish
    Title of host publicationTransmission Electron Microscopy Characterization of Nanomaterials
    PublisherSpringer Berlin Heidelberg
    Pages287-331
    Number of pages45
    ISBN (Electronic)9783642389344
    ISBN (Print)9783642389337
    DOIs
    Publication statusPublished - 2014 Jan 1

    ASJC Scopus subject areas

    • Chemistry(all)
    • Engineering(all)
    • Agricultural and Biological Sciences(all)

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