Valence electron spectroscopy for transmission electron microscopy

Research output: Chapter in Book/Report/Conference proceedingChapter

8 Citations (Scopus)

Abstract

Soft-X-ray emission spectroscopy (SXES) based on transmission electron microscopy can give us information of energy state of valence electrons (bonding electrons) from small specimen areas examined by microscopy, electron diffraction, and elemental analysis. The information of valence electrons cannot be directly obtained by electron energy-loss spectroscopy (EELS) widely used nowadays. In this chapter, developments of SXES instruments for conventional transmission electron microscopes (TEMs) and those results applied to materials to obtain information of valence electrons are described.

Original languageEnglish
Title of host publicationTransmission Electron Microscopy Characterization of Nanomaterials
PublisherSpringer Berlin Heidelberg
Pages287-331
Number of pages45
ISBN (Electronic)9783642389344
ISBN (Print)9783642389337
DOIs
Publication statusPublished - 2014 Jan 1

ASJC Scopus subject areas

  • Chemistry(all)
  • Engineering(all)
  • Agricultural and Biological Sciences(all)

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    Terauchi, M. (2014). Valence electron spectroscopy for transmission electron microscopy. In Transmission Electron Microscopy Characterization of Nanomaterials (pp. 287-331). Springer Berlin Heidelberg. https://doi.org/10.1007/978-3-642-38934-4_7