TY - JOUR
T1 - Vacuum ultraviolet fluorescence spectroscopy of Nd3+:LaF 3 using femtosecond extreme ultraviolet free electron laser
AU - Shinzato, Yuki
AU - Yamanoi, Kohei
AU - Nishi, Ryosuke
AU - Takeda, Kohei
AU - Nakazato, Tomoharu
AU - Shimizu, Toshihiko
AU - Sarukura, Nobuhiko
AU - Cadatal-Raduban, Marilou
AU - Fukuda, Kentaro
AU - Kurosawa, Shunsuke
AU - Yokota, Yuui
AU - Yoshikawa, Akira
AU - Togashi, Tadashi
AU - Nagasono, Mitsuru
AU - Ishikawa, Tetsuya
PY - 2013/2/1
Y1 - 2013/2/1
N2 - Time-resolved vacuum ultraviolet (VUV) fluorescence was observed from a Czochralski method-grown Nd3+:LaF3 crystal excited by 61 nm femtosecond pulses from the extreme ultraviolet free-electron laser (EUV-FEL). The 172 nm fluorescence peak exhibited double exponential fluorescence decay with slow and fast decay components of 6.7 and 1.9 ns, respectively. The spectral profile is similar to those previously reported, but the double exponential nature has never been attained using conventional short-wavelength pulsed lasers. Our results demonstrate the importance of the EUV-FEL for short-wavelength spectroscopy, not just for rare-earth-doped fluorides but also for wide-band-gap semiconductors such as AlGaN.
AB - Time-resolved vacuum ultraviolet (VUV) fluorescence was observed from a Czochralski method-grown Nd3+:LaF3 crystal excited by 61 nm femtosecond pulses from the extreme ultraviolet free-electron laser (EUV-FEL). The 172 nm fluorescence peak exhibited double exponential fluorescence decay with slow and fast decay components of 6.7 and 1.9 ns, respectively. The spectral profile is similar to those previously reported, but the double exponential nature has never been attained using conventional short-wavelength pulsed lasers. Our results demonstrate the importance of the EUV-FEL for short-wavelength spectroscopy, not just for rare-earth-doped fluorides but also for wide-band-gap semiconductors such as AlGaN.
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U2 - 10.7567/APEX.6.022401
DO - 10.7567/APEX.6.022401
M3 - Article
AN - SCOPUS:84875155630
VL - 6
JO - Applied Physics Express
JF - Applied Physics Express
SN - 1882-0778
IS - 2
M1 - 022401
ER -