UV-Raman spectroscopy study on SiO2/Si interface

M. Hattori, T. Yoshida, D. Kosemura, A. Ogura, T. Suwa, Akinobu Teramoto, Takeo Hattori, T. Ohmi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Citations (Scopus)

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Engineering & Materials Science