Using an electroconductive carbon nanotube probe tip in scanning nonlinear dielectric microscopy

K. Ishikawa, Y. Cho

Research output: Contribution to journalArticlepeer-review

3 Citations (Scopus)

Abstract

A scanning nonlinear dielectric microscope (SNDM), which can be used for detecting the surface and subsurface of ferroelectric polarization with high resolution, has been developed. Contact-mode atomic force microscopy typically uses a metal-coated conductive cantilever tip; however, SNDM imaging resolution declines upon repeated scanning because of the abrasion of the tip in the contact mode. To improve the lateral resolution of the tip, we used an electroconductive carbon nanotube (CNT) probe tip. Using the SNDM with the CNT probe, the ferroelectric domain boundary of stoichiometric lithium tantalate (LiTa O3) is observed in air at room temperature and the results compared with those obtained using a platinum-coated tip.

Original languageEnglish
Article number103708
JournalReview of Scientific Instruments
Volume77
Issue number10
DOIs
Publication statusPublished - 2006 Nov 7

ASJC Scopus subject areas

  • Instrumentation

Fingerprint

Dive into the research topics of 'Using an electroconductive carbon nanotube probe tip in scanning nonlinear dielectric microscopy'. Together they form a unique fingerprint.

Cite this