Understanding of traps causing random telegraph noise based on experimentally extracted time constants and amplitude

Kenichi Abe, Akinobu Teramoto, Shigetoshi Sugawa, Tadahiro Ohmi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

26 Citations (Scopus)

Abstract

We develop a high-speed method to extract time constants and noise amplitude of random telegraph noise (RTN). We investigate distributions of these RTN parameters for more than 270 n- and p-MOSFETs and clarify spectroscopy of traps causing RTN. Most of traps are distributed in an energy range of 220 meV, and mean times to capture/emission are measured in a wide range between 10 μs and 20 ms.

Original languageEnglish
Title of host publication2011 International Reliability Physics Symposium, IRPS 2011
Pages4A.4.1-4A.4.6
DOIs
Publication statusPublished - 2011
Event49th International Reliability Physics Symposium, IRPS 2011 - Monterey, CA, United States
Duration: 2011 Apr 102011 Apr 14

Publication series

NameIEEE International Reliability Physics Symposium Proceedings
ISSN (Print)1541-7026

Other

Other49th International Reliability Physics Symposium, IRPS 2011
CountryUnited States
CityMonterey, CA
Period11/4/1011/4/14

Keywords

  • energy distribution
  • random telegraph noise
  • time constant
  • trap

ASJC Scopus subject areas

  • Engineering(all)

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