Understanding of traps causing random telegraph noise based on experimentally extracted time constants and amplitude

Kenichi Abe; Akinobu Teramoto; Shigetoshi Sugawa; Tadahiro Ohmi

doi:10.1109/IRPS.2011.5784503

Understanding of traps causing random telegraph noise based on experimentally extracted time constants and amplitude

Kenichi Abe, Akinobu Teramoto, Shigetoshi Sugawa, Tadahiro Ohmi

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

26 Citations (Scopus)

Abstract

We develop a high-speed method to extract time constants and noise amplitude of random telegraph noise (RTN). We investigate distributions of these RTN parameters for more than 270 n- and p-MOSFETs and clarify spectroscopy of traps causing RTN. Most of traps are distributed in an energy range of 220 meV, and mean times to capture/emission are measured in a wide range between 10 μs and 20 ms.

Original language	English
Title of host publication	2011 International Reliability Physics Symposium, IRPS 2011
Pages	4A.4.1-4A.4.6
DOIs	https://doi.org/10.1109/IRPS.2011.5784503
Publication status	Published - 2011
Event	49th International Reliability Physics Symposium, IRPS 2011 - Monterey, CA, United States Duration: 2011 Apr 10 → 2011 Apr 14

Publication series

Name	IEEE International Reliability Physics Symposium Proceedings
ISSN (Print)	1541-7026

Other

Other	49th International Reliability Physics Symposium, IRPS 2011
Country	United States
City	Monterey, CA
Period	11/4/10 → 11/4/14

Keywords

energy distribution
random telegraph noise
time constant
trap

ASJC Scopus subject areas

Engineering(all)

Access to Document

10.1109/IRPS.2011.5784503

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Abe, K., Teramoto, A., Sugawa, S., & Ohmi, T. (2011). Understanding of traps causing random telegraph noise based on experimentally extracted time constants and amplitude. In 2011 International Reliability Physics Symposium, IRPS 2011 (pp. 4A.4.1-4A.4.6). [5784503] (IEEE International Reliability Physics Symposium Proceedings). https://doi.org/10.1109/IRPS.2011.5784503

Understanding of traps causing random telegraph noise based on experimentally extracted time constants and amplitude. / Abe, Kenichi; Teramoto, Akinobu; Sugawa, Shigetoshi; Ohmi, Tadahiro.

2011 International Reliability Physics Symposium, IRPS 2011. 2011. p. 4A.4.1-4A.4.6 5784503 (IEEE International Reliability Physics Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abe, K, Teramoto, A, Sugawa, S & Ohmi, T 2011, Understanding of traps causing random telegraph noise based on experimentally extracted time constants and amplitude. in 2011 International Reliability Physics Symposium, IRPS 2011., 5784503, IEEE International Reliability Physics Symposium Proceedings, pp. 4A.4.1-4A.4.6, 49th International Reliability Physics Symposium, IRPS 2011, Monterey, CA, United States, 11/4/10. https://doi.org/10.1109/IRPS.2011.5784503

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