Understanding of traps causing random telegraph noise based on experimentally extracted time constants and amplitude

Kenichi Abe; Akinobu Teramoto; Shigetoshi Sugawa; Tadahiro Ohmi

doi:10.1109/IRPS.2011.5784503

Understanding of traps causing random telegraph noise based on experimentally extracted time constants and amplitude

Kenichi Abe, Akinobu Teramoto, Shigetoshi Sugawa, Tadahiro Ohmi

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

30 Citations (Scopus)

Abstract

We develop a high-speed method to extract time constants and noise amplitude of random telegraph noise (RTN). We investigate distributions of these RTN parameters for more than 270 n- and p-MOSFETs and clarify spectroscopy of traps causing RTN. Most of traps are distributed in an energy range of 220 meV, and mean times to capture/emission are measured in a wide range between 10 μs and 20 ms.

Original language	English
Title of host publication	2011 International Reliability Physics Symposium, IRPS 2011
Pages	4A.4.1-4A.4.6
DOIs	https://doi.org/10.1109/IRPS.2011.5784503
Publication status	Published - 2011
Event	49th International Reliability Physics Symposium, IRPS 2011 - Monterey, CA, United States Duration: 2011 Apr 10 → 2011 Apr 14

Publication series

Name	IEEE International Reliability Physics Symposium Proceedings
ISSN (Print)	1541-7026

Other

Other	49th International Reliability Physics Symposium, IRPS 2011
Country/Territory	United States
City	Monterey, CA
Period	11/4/10 → 11/4/14

Keywords

energy distribution
random telegraph noise
time constant
trap

ASJC Scopus subject areas

Engineering(all)

Access to Document

10.1109/IRPS.2011.5784503

Cite this

Abe, K., Teramoto, A., Sugawa, S., & Ohmi, T. (2011). Understanding of traps causing random telegraph noise based on experimentally extracted time constants and amplitude. In 2011 International Reliability Physics Symposium, IRPS 2011 (pp. 4A.4.1-4A.4.6). [5784503] (IEEE International Reliability Physics Symposium Proceedings). https://doi.org/10.1109/IRPS.2011.5784503

Understanding of traps causing random telegraph noise based on experimentally extracted time constants and amplitude. / Abe, Kenichi; Teramoto, Akinobu; Sugawa, Shigetoshi; Ohmi, Tadahiro.

2011 International Reliability Physics Symposium, IRPS 2011. 2011. p. 4A.4.1-4A.4.6 5784503 (IEEE International Reliability Physics Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abe, K, Teramoto, A, Sugawa, S & Ohmi, T 2011, Understanding of traps causing random telegraph noise based on experimentally extracted time constants and amplitude. in 2011 International Reliability Physics Symposium, IRPS 2011., 5784503, IEEE International Reliability Physics Symposium Proceedings, pp. 4A.4.1-4A.4.6, 49th International Reliability Physics Symposium, IRPS 2011, Monterey, CA, United States, 11/4/10. https://doi.org/10.1109/IRPS.2011.5784503

@inproceedings{2dfe0f4a85464f46b6c395a6eb008180,

title = "Understanding of traps causing random telegraph noise based on experimentally extracted time constants and amplitude",

abstract = "We develop a high-speed method to extract time constants and noise amplitude of random telegraph noise (RTN). We investigate distributions of these RTN parameters for more than 270 n- and p-MOSFETs and clarify spectroscopy of traps causing RTN. Most of traps are distributed in an energy range of 220 meV, and mean times to capture/emission are measured in a wide range between 10 μs and 20 ms.",

keywords = "energy distribution, random telegraph noise, time constant, trap",

author = "Kenichi Abe and Akinobu Teramoto and Shigetoshi Sugawa and Tadahiro Ohmi",

year = "2011",

doi = "10.1109/IRPS.2011.5784503",

language = "English",

isbn = "9781424491117",

series = "IEEE International Reliability Physics Symposium Proceedings",

pages = "4A.4.1--4A.4.6",

booktitle = "2011 International Reliability Physics Symposium, IRPS 2011",

}

TY - GEN

T1 - Understanding of traps causing random telegraph noise based on experimentally extracted time constants and amplitude

AU - Abe, Kenichi

AU - Teramoto, Akinobu

AU - Sugawa, Shigetoshi

AU - Ohmi, Tadahiro

PY - 2011

Y1 - 2011

N2 - We develop a high-speed method to extract time constants and noise amplitude of random telegraph noise (RTN). We investigate distributions of these RTN parameters for more than 270 n- and p-MOSFETs and clarify spectroscopy of traps causing RTN. Most of traps are distributed in an energy range of 220 meV, and mean times to capture/emission are measured in a wide range between 10 μs and 20 ms.

AB - We develop a high-speed method to extract time constants and noise amplitude of random telegraph noise (RTN). We investigate distributions of these RTN parameters for more than 270 n- and p-MOSFETs and clarify spectroscopy of traps causing RTN. Most of traps are distributed in an energy range of 220 meV, and mean times to capture/emission are measured in a wide range between 10 μs and 20 ms.

KW - energy distribution

KW - random telegraph noise

KW - time constant

KW - trap

UR - http://www.scopus.com/inward/record.url?scp=79959299921&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=79959299921&partnerID=8YFLogxK

U2 - 10.1109/IRPS.2011.5784503

DO - 10.1109/IRPS.2011.5784503

M3 - Conference contribution

AN - SCOPUS:79959299921

SN - 9781424491117

T3 - IEEE International Reliability Physics Symposium Proceedings

SP - 4A.4.1-4A.4.6

BT - 2011 International Reliability Physics Symposium, IRPS 2011

T2 - 49th International Reliability Physics Symposium, IRPS 2011

Y2 - 10 April 2011 through 14 April 2011

ER -

Understanding of traps causing random telegraph noise based on experimentally extracted time constants and amplitude

Abstract

Publication series

Other

Keywords

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

Cite this