Understanding of BTI for tunnel FETs

W. Mizubayashi, T. Mori, K. Fukuda, Y. Ishikawa, Y. Morita, S. Migita, H. Ota, Y. X. Liu, S. O'Uchi, J. Tsukada, H. Yamauchi, T. Matsukawa, M. Masahara, K. Endo

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)


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