Ultraviolet 363.8-nm Raman spectroscopic system for in situ measurements at high temperatures

Masatomo Yashima, Masato Kakihana, Ryosuke Shimidzu, Hirotaka Fujimori, Masahiro Yoshimura

    Research output: Contribution to journalArticlepeer-review

    26 Citations (Scopus)

    Abstract

    A new ultraviolet (UV) Raman spectroscopic system to measure the Raman scattering from materials at high temperatures up to 1500 °C has been designed. This system is based on a CW (continuouswave) ultraviolet argon-ion laser (363.8 nm), a spatial filter, a single monochromator coupled to a double-grating rejection filter, and a two-dimensional charge-coupled device (CCD) detector. The plasma lines from the laser are almost completely rejected by a Pellin-Broca prism combined with apertures. Jn situ Raman measurements for a zirconia (ZrO2) specimen at various high temperatures have been performed by using the UV excitation as well as the conventional visible 488.0-n m excitation for comparison. In the case of visible excitation, thermal emission obstructs the observation of the Raman scattering from zirconia even at 900°C; it becomes rapidly pronounced between 900 and 1100°C, and finally it is impossible to observe Raman spectra at temperatures higher than 1200 °C. In sharp contrast to the visible excitation, the UV excitation provides good-quality Raman spectra with practically flat backgrounds for the Raman signal of tetragonal zirconia in the spectral region of 20-1100 cm-1 even at 1500°C, and it enables clear observation of the monoclinic-tetragonal phase transformation of zirconia occurring between 1100 and 1200°C.

    Original languageEnglish
    Pages (from-to)1224-1228
    Number of pages5
    JournalApplied spectroscopy
    Volume51
    Issue number8
    DOIs
    Publication statusPublished - 1997 Aug

    Keywords

    • Elimination of thermal emission
    • Excitation of Raman scattering by an ultraviolet 363.8-nm continuous-wave laser
    • Instrumentation
    • Raman spectroscopy instrumentation
    • Raman spectroscopy with charge-coupled device detection
    • Spatial filter

    ASJC Scopus subject areas

    • Instrumentation
    • Spectroscopy

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