Ultrasonic atomic force microscopy UAFM

Kazushi Yamanaka, Toshihiro Tsuji

Research output: Chapter in Book/Report/Conference proceedingChapter

4 Citations (Scopus)

Abstract

A version of scanning probe acoustic technique was developed as ultrasonic atomic force microscopy (UAFM), where higher order mode cantilever vibration is excited at its base (support). It enables precise imaging of both topography and elasticity of stiff samples such as metals and ceramics, without a need for bonding a transducer to the sample. By virtue of this advantage, a range of unique analysis and hardware has been developed. In this chapter, after briefly summarizing the concept of UAFM, basic mathematical analysis, mechanical, and electronic instrumentation are described, including a noise-free cantilever holder and analogue/digital fast resonance frequency tracking circuit. The final section describes illustrative examples first realized by this technique as an introduction for later chapters of applications (e.g. subsurface defects).

Original languageEnglish
Title of host publicationNanoScience and Technology
PublisherSpringer-Verlag
Pages155-187
Number of pages33
Edition9783642274930
DOIs
Publication statusPublished - 2013 Jan 1

Publication series

NameNanoScience and Technology
Number9783642274930
ISSN (Print)1434-4904

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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