Abstract
We have developed a new imaging method, ultrafast optical wide field microscopy, capable of rapidly acquiring wide field images of nearly any sample in a non-contact manner with high spatial and temporal resolution. Time-resolved images of the photoinduced changes in transmission for a patterned semiconductor thin film and a single silicon nanowire after optical excitation are captured using a two-dimensional smart pixel array detector. These images represent the time-dependent carrier dynamics with high sensitivity, femtosecond time resolution and sub-micrometer spatial resolution.
Original language | English |
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Pages (from-to) | 8763-8772 |
Number of pages | 10 |
Journal | Optics Express |
Volume | 21 |
Issue number | 7 |
DOIs | |
Publication status | Published - 2013 Apr 8 |
ASJC Scopus subject areas
- Atomic and Molecular Physics, and Optics