Ultrafast optical wide field microscopy

M. Seo, S. Boubanga-Tombet, J. Yoo, Z. Ku, A. V. Gin, S. T. Picraux, S. R.J. Brueck, A. J. Taylor, R. P. Prasankumar

Research output: Contribution to journalArticlepeer-review

12 Citations (Scopus)


We have developed a new imaging method, ultrafast optical wide field microscopy, capable of rapidly acquiring wide field images of nearly any sample in a non-contact manner with high spatial and temporal resolution. Time-resolved images of the photoinduced changes in transmission for a patterned semiconductor thin film and a single silicon nanowire after optical excitation are captured using a two-dimensional smart pixel array detector. These images represent the time-dependent carrier dynamics with high sensitivity, femtosecond time resolution and sub-micrometer spatial resolution.

Original languageEnglish
Pages (from-to)8763-8772
Number of pages10
JournalOptics Express
Issue number7
Publication statusPublished - 2013 Apr 8

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics


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