Ultrafast optical wide field microscopy

M. Seo; S. Boubanga-Tombet; J. Yoo; Z. Ku; A. V. Gin; S. T. Picraux; S. R.J. Brueck; A. J. Taylor; R. P. Prasankumar

doi:10.1364/OE.21.008763

Ultrafast optical wide field microscopy

M. Seo, S. Boubanga-Tombet, J. Yoo, Z. Ku, A. V. Gin, S. T. Picraux, S. R.J. Brueck, A. J. Taylor, R. P. Prasankumar

Broadband Engineering Division

Research output: Contribution to journal › Article › peer-review

12 Citations (Scopus)

Abstract

We have developed a new imaging method, ultrafast optical wide field microscopy, capable of rapidly acquiring wide field images of nearly any sample in a non-contact manner with high spatial and temporal resolution. Time-resolved images of the photoinduced changes in transmission for a patterned semiconductor thin film and a single silicon nanowire after optical excitation are captured using a two-dimensional smart pixel array detector. These images represent the time-dependent carrier dynamics with high sensitivity, femtosecond time resolution and sub-micrometer spatial resolution.

Original language	English
Pages (from-to)	8763-8772
Number of pages	10
Journal	Optics Express
Volume	21
Issue number	7
DOIs	https://doi.org/10.1364/OE.21.008763
Publication status	Published - 2013 Apr 8

ASJC Scopus subject areas

Atomic and Molecular Physics, and Optics

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AU - Seo, M.

AU - Boubanga-Tombet, S.

AU - Yoo, J.

AU - Ku, Z.

AU - Gin, A. V.

AU - Picraux, S. T.

AU - Brueck, S. R.J.

AU - Taylor, A. J.

AU - Prasankumar, R. P.

PY - 2013/4/8

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Ultrafast optical wide field microscopy

Abstract

ASJC Scopus subject areas

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